Silicon Carbide Sic Porous Ceramic Disc
The Silicon Carbide (SiC) Porous Ceramic Disc from Semixlab is designed for high-performance semiconductor wafer processing applications that demand precision, purity, and durability. With controlled micro-porosity, superior thermal conductivity, and chemical inertness, this component plays a crucial role in vacuum chucking, CMP (Chemical Mechanical Polishing), epitaxy, and wafer handling systems.
Description
Ideal for: CMP platforms, MOCVD epitaxy reactors, wafer transfer modules, plasma cleaning systems, and ESC substrate assemblies.
Ⅰ. Material Composition and Physical Characteristics
High-Purity SiC Ceramic Structure
Crafted from ≥99.9% ultra-pure α-SiC or β-SiC powders, each porous disc is manufactured through precision-controlled sintering and infiltration processes. The result is a uniform pore network that ensures stable gas flow and mechanical integrity under extreme processing environments.
Key Technical Properties:
| Property | Specification |
| Material | α-SiC / β-SiC |
| Purity | ≥99.9% |
| Porosity | 10–40% (adjustable) |
| Pore Size | 0.1–10 μm |
| Thermal Conductivity | 120–200 W/m·K |
| Max Operating Temp | 1600–1800°C |
| Hardness | Mohs 9.3 |
| Chemical Resistance | Excellent in HF, HCl, Cl₂, H₂ |
| Density | 2.8–3.1 g/cm³ |
Performance Highlights:
● Uniform Vacuum Permeability: Precise pore distribution ensures balanced gas flow across the wafer surface.
● Excellent Thermal Stability: Maintains mechanical integrity under high-temperature cycling.
● Low Particle Generation: Polished SiC surfaces minimize contamination risk.
● Superior Durability: Extended service life even in aggressive chemical and plasma environments.
Ⅱ. Common Process Challenges and Semixlab Solutions
| Challenge | Root Cause | Semixlab Solutions |
| Uneven Vacuum Suction | Non-uniform pore size or clogging | Controlled pore size distribution and periodic plasma cleaning |
| Particle Contamination | Micro-cracks from thermal cycling | Apply CVD SiC coating for surface strengthening |
| Thermal Non-Uniformity | Uneven density or contamination | Use high-conductivity SiC (>150 W/m`K) and polished surfaces |
| Chemical Erosion | Prolonged exposure to HF or Cl-based gases | Adopt dense CVD SiC hybrid sintering to enhance corrosion resistance |
| Reduced Mechanical Strength Over Time | Repeated wafer loading stress | Secondary infiltration to improve fracture toughness and extend service life |
Semixlab’s proprietary material control and surface engineering ensure consistent performance, long-term reliability, and reduced equipment downtime across multiple process cycles. Welcome to consult us for further technical consultation and product customization services.
Applications
Applications in Semiconductor Processes
1. Wafer Vacuum Chucking and Handling
Porous SiC discs are widely used as vacuum chuck plates or carrier supports in wafer loading and transfer systems. Their precisely engineered porosity ensures uniform vacuum suction, eliminating wafer deformation and improving alignment accuracy.
2. Chemical Mechanical Polishing (CMP)
During CMP, the porous SiC disc serves as a carrier or backing plate, enabling:
● Even slurry distribution
● Stable wafer support
● Improved planarity and defect control
Compared to conventional alumina or quartz, SiC offers higher hardness and thermal conductivity, ensuring a longer lifespan and improved process consistency.
3. Epitaxy and High-Temperature Processing
In MOCVD and LPE epitaxial reactors, the SiC porous disc functions as a thermal susceptor base or support platform, ensuring:
● Uniform heat transfer across the wafer
● Stable epitaxial layer thickness
● High resistance to reactive process gases
4. Wet & Plasma Cleaning Systems
Thanks to its chemical and plasma corrosion resistance, the porous SiC disc performs effectively as a gas diffusion plate or chemical filtration substrate in wet benches and cleaning chambers.
5. ESC (Electrostatic Chuck) Base Layer
In advanced wafer stages, porous SiC ceramics act as thermal bases for ESCs, combining excellent heat transfer and electrical insulation for precise wafer temperature control.
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