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SiC Ceramics
Silicon Carbide Sic Porous Ceramic Disc
Silicon Carbide Sic Porous Ceramic Disc

Silicon Carbide Sic Porous Ceramic Disc


The Silicon Carbide (SiC) Porous Ceramic Disc from Semixlab is designed for high-performance semiconductor wafer processing applications that demand precision, purity, and durability. With controlled micro-porosity, superior thermal conductivity, and chemical inertness, this component plays a crucial role in vacuum chucking, CMP (Chemical Mechanical Polishing), epitaxy, and wafer handling systems.

Description

Ideal for: CMP platforms, MOCVD epitaxy reactors, wafer transfer modules, plasma cleaning systems, and ESC substrate assemblies.

Ⅰ. Material Composition and Physical Characteristics

High-Purity SiC Ceramic Structure

Crafted from ≥99.9% ultra-pure α-SiC or β-SiC powders, each porous disc is manufactured through precision-controlled sintering and infiltration processes. The result is a uniform pore network that ensures stable gas flow and mechanical integrity under extreme processing environments.

Key Technical Properties:

PropertySpecification
Materialα-SiC / β-SiC
Purity≥99.9%
Porosity10–40% (adjustable)
Pore Size0.1–10 μm
Thermal Conductivity120–200 W/m·K
Max Operating Temp1600–1800°C
HardnessMohs 9.3
Chemical ResistanceExcellent in HF, HCl, Cl₂, H₂
Density2.8–3.1 g/cm³

Performance Highlights:

● Uniform Vacuum Permeability: Precise pore distribution ensures balanced gas flow across the wafer surface.

● Excellent Thermal Stability: Maintains mechanical integrity under high-temperature cycling.

● Low Particle Generation: Polished SiC surfaces minimize contamination risk.

● Superior Durability: Extended service life even in aggressive chemical and plasma environments.

Ⅱ. Common Process Challenges and Semixlab Solutions

ChallengeRoot CauseSemixlab Solutions
Uneven Vacuum SuctionNon-uniform pore size or cloggingControlled pore size distribution and periodic plasma cleaning
Particle ContaminationMicro-cracks from thermal cyclingApply CVD SiC coating for surface strengthening
Thermal Non-UniformityUneven density or contaminationUse high-conductivity SiC (>150 W/m`K) and polished surfaces
Chemical ErosionProlonged exposure to HF or Cl-based gasesAdopt dense CVD SiC hybrid sintering to enhance corrosion resistance
Reduced Mechanical Strength Over TimeRepeated wafer loading stressSecondary infiltration to improve fracture toughness and extend service life

Semixlab’s proprietary material control and surface engineering ensure consistent performance, long-term reliability, and reduced equipment downtime across multiple process cycles. Welcome to consult us for further technical consultation and product customization services.

Applications

Applications in Semiconductor Processes

1. Wafer Vacuum Chucking and Handling

Porous SiC discs are widely used as vacuum chuck plates or carrier supports in wafer loading and transfer systems. Their precisely engineered porosity ensures uniform vacuum suction, eliminating wafer deformation and improving alignment accuracy.

2. Chemical Mechanical Polishing (CMP)

During CMP, the porous SiC disc serves as a carrier or backing plate, enabling:

● Even slurry distribution

● Stable wafer support

● Improved planarity and defect control

Compared to conventional alumina or quartz, SiC offers higher hardness and thermal conductivity, ensuring a longer lifespan and improved process consistency.

3. Epitaxy and High-Temperature Processing

In MOCVD and LPE epitaxial reactors, the SiC porous disc functions as a thermal susceptor base or support platform, ensuring:

● Uniform heat transfer across the wafer

● Stable epitaxial layer thickness

● High resistance to reactive process gases

4. Wet & Plasma Cleaning Systems

Thanks to its chemical and plasma corrosion resistance, the porous SiC disc performs effectively as a gas diffusion plate or chemical filtration substrate in wet benches and cleaning chambers.

5. ESC (Electrostatic Chuck) Base Layer

In advanced wafer stages, porous SiC ceramics act as thermal bases for ESCs, combining excellent heat transfer and electrical insulation for precise wafer temperature control.

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