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AMAT 0200-10243 Shadow Ring 150mm
AMAT 0200-10243 Shadow Ring 150mm

0200-10243 Shadow Ring 150mm


The AMAT 0200-10243 Shadow Ring 150mm is designed for semiconductor etch and deposition systems. Positioned around the wafer edge, it plays a critical role in controlling plasma distribution, improving edge uniformity, and minimizing contamination. Manufactured from high-purity fused quartz, this shadow ring effectively reduces edge defects, enhances film thickness consistency, and supports repeatable process outcomes. At Semixlab Technology, our shadow ring solutions are optimized for dimensional accuracy, material purity, and long service life—helping semiconductor manufacturers improve yield, reduce maintenance frequency, and maintain process stability. Looking forward to your inquiry.

Description

1. Product Overview

The AMAT 0200-10243 Shadow Ring 150mm is a high-precision quartz consumable component designed for use in 150mm semiconductor processing systems, particularly in etching and CVD chambers.

Manufactured from high-purity fused quartz, this shadow ring is engineered to withstand harsh plasma environments while maintaining dimensional stability and low contamination levels. It is specifically designed to fit Applied Materials platforms, ensuring compatibility and reliable process integration.

At Semixlab Technology, we provide high-quality replacement shadow rings with strict control over material purity, machining accuracy, and surface finish to meet the stringent requirements of advanced semiconductor manufacturing.

2. Position in Equipment & Functional Role

The shadow ring is installed around the outer perimeter of the wafer inside the process chamber, forming a critical interface between the wafer edge and the surrounding plasma environment.

Typical placement:

● Surrounding the wafer on the electrostatic chuck (ESC) or susceptor

● Located within plasma exposure zone

● Positioned between wafer edge and chamber wall

Functional role in the system:

● Acts as a physical and process boundary layer

● Influences plasma distribution and edge electric field behavior

● Serves as a sacrificial protection component against direct plasma exposure

In advanced semiconductor equipment, even slight variations in edge conditions can significantly impact overall process performance, making the shadow ring a key element in process control architecture.

3. Core Functions & Process Impact

The AMAT 0200-10243 Shadow Ring plays a vital role in ensuring process uniformity, yield stability, and contamination control.

Edge Protection

● Shields wafer edges from direct plasma bombardment

● Reduces edge damage, notching, and abnormal etch profiles

Plasma Distribution Optimization

● Modulates local plasma density near the wafer edge

● Prevents edge over-etching or excessive deposition

Uniformity Enhancement

● Improves etch rate and film thickness consistency across the wafer

● Minimizes edge exclusion zones

Contamination Control

● Captures process by-products and particles

● Reduces risk of contamination reaching active wafer surfaces

Process Stability

● Maintains repeatable process conditions across multiple cycles

● Supports tighter control over CD (critical dimension) and film properties

4. Typical Failure Modes & Replacement Considerations

Due to continuous exposure to plasma, high temperatures, and reactive gases, shadow rings are subject to gradual degradation. Understanding failure mechanisms is essential for maintaining process stability.

Common Failure Modes:

① Plasma Erosion

Surface material loss caused by ion bombardment

Leads to dimensional changes and altered plasma behavior

② Chemical Corrosion

Reaction with aggressive gases (e.g., fluorine-based chemistries)

Results in surface roughening and structural weakening

③ Particle Generation

Micro-cracks or surface degradation can release particles

Increases contamination risk and reduces yield

④ Deposition Build-up

Accumulation of process by-products (e.g., polymer residues)

Alters local process conditions and plasma distribution

⑤ Thermal Stress & Cracking

Repeated thermal cycling may induce microfractures

Compromises mechanical integrity over time

Impact of Failure:

● Increased particle contamination

● Edge CD variation and non-uniformity

● Reduced wafer yield

● Process drift and reduced repeatability

● Increased chamber maintenance frequency

Competitive Advantage

At Semixlab Technology, we address these challenges through:

● High-purity quartz material selection for reduced contamination

● Precision machining for tight dimensional tolerance

● Optimized surface treatment to enhance plasma resistance

● Optional advanced coating solutions (e.g., SiC coating) for extended lifetime and reduced particle generation

Looking for a reliable alternative or performance upgrade?

Semixlab Technology offers engineered shadow ring solutions and advanced coating options tailored to your specific process requirements. Contact us today to optimize your semiconductor process performance.

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