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Quartz Gas Distribution Super E Quartz_副本
Quartz Gas Distribution Super E Quartz_副本

Gas Distribution Super E


The Gas Distribution Super E 0200-00410 is a precision-manufactured quartz gas distribution plate (GDP) designed for semiconductor plasma processing equipment. This component is installed in the upper region of the process chamber, where it plays a crucial role in delivering uniform process gas flow across the wafer surface. Manufactured from high-purity fused quartz, the gas distribution plate provides excellent resistance to plasma corrosion, high thermal stability, and extremely low contamination levels. The 0200-00410 Gas Distribution Plate features a precision multi-hole gas outlet design that ensures consistent gas dispersion during plasma etching and deposition processes. By maintaining stable gas flow distribution, it helps improve etch uniformity, process repeatability, and overall wafer yield. Welcome your inquiry.

Description

The Gas Distribution Super E 0200-00410 is a precision-engineered quartz gas distribution plate (GDP) designed for semiconductor plasma processing equipment. Installed in the upper section of the process chamber, this component ensures uniform delivery of process gases across the wafer surface, enabling stable plasma generation and consistent wafer processing results.

Manufactured from semiconductor-grade high-purity fused quartz, the 0200-00410 gas distribution plate offers excellent resistance to plasma corrosion, superior thermal stability, and extremely low contamination levels. These properties make it a critical component in advanced semiconductor manufacturing environments where process uniformity and chamber cleanliness are essential.

At Semixlab, we specialize in supplying high-precision quartz components for semiconductor equipment, engineered to meet strict industry standards for dimensional accuracy, purity, and long-term reliability.

Product Overview

ItemDescription
Product NameGas Distribution Super E
OEM Part Number0200-00410
Component TypeGas Distribution Plate (GDP)
MaterialHigh-Purity Fused Quartz
ApplicationSemiconductor Plasma Etching / Deposition
StructureMulti-hole gas distribution design
Typical Hole CountMulti-channel precision gas outlets
Manufacturing ProcessPrecision CNC Machining & Semiconductor-grade finishing

The 0200-00410 Gas Distribution Plate is designed to precisely distribute process gases into the reaction chamber, ensuring stable and uniform gas flow over the entire wafer surface.

This component is widely used in plasma etching and deposition equipment, where accurate gas flow control directly affects plasma stability, etch rate uniformity, and overall process performance.

Typical Structural Features

The 0200-00410 Gas Distribution Plate is designed with structural characteristics optimized for high-precision semiconductor equipment.

Multi-Hole Gas Outlet Design:

The plate features a precisely engineered array of gas distribution holes that allow controlled and uniform gas injection into the process chamber.

Circular Geometry Matching Wafer Processing Area:

The circular design aligns with the wafer processing region, ensuring that gas flow remains evenly distributed across the wafer surface.

Precision Machining:

Advanced CNC machining processes ensure tight dimensional tolerances and accurate gas hole placement, which are essential for maintaining stable gas flow patterns.

Smooth Quartz Surface Finish:

The surface of the plate is carefully finished to minimize particle generation and maintain compatibility with ultra-clean semiconductor manufacturing environments.

Structural Stability:

The optimized thickness and mechanical strength of the quartz plate ensure reliable operation under high-temperature plasma processing conditions.

Applications

Role in Semiconductor Equipment

The Gas Distribution Plate is one of the most important components inside semiconductor plasma processing chambers. Its primary role is to ensure precise and uniform gas delivery, which directly affects process performance and wafer quality.

Uniform Process Gas Distribution:

The multi-hole design enables process gases to be evenly distributed across the wafer surface. This helps maintain consistent gas concentration throughout the chamber and improves overall process uniformity.

Plasma Stability Enhancement:

Stable gas flow is critical for maintaining consistent plasma density. By evenly distributing gases, the gas distribution plate contributes to stable plasma generation and improved process repeatability.

Process Uniformity Improvement:

Accurate gas flow control ensures that the etching or deposition rate remains consistent across the wafer surface, reducing edge-to-center variation.

Chamber Protection:

The component also acts as a structural interface between the gas delivery system and the reaction chamber, helping protect surrounding chamber components while maintaining stable process conditions.

Competitive Advantage

Material and Key Advantages

The Gas Distribution Super E 0200-00410 is manufactured using high-purity fused quartz (SiO₂), a material widely adopted in semiconductor processing due to its outstanding physical and chemical properties.

High Plasma Resistance: Quartz demonstrates excellent resistance to aggressive plasma environments commonly found in semiconductor processes, including fluorine-based and chlorine-based chemistries. This ensures stable performance and long operational lifetime.

Ultra-Low Contamination: Semiconductor-grade quartz contains extremely low levels of metallic impurities. This helps prevent contamination inside the process chamber and supports high wafer yield and device reliability.

Excellent Thermal Stability: Quartz offers exceptional resistance to high temperatures and thermal cycling, making it suitable for demanding plasma processing conditions.

Chemical Inertness: The material remains chemically stable in reactive environments, reducing surface degradation and minimizing particle generation during long-term operation.

Electrical Insulation: As an electrically insulating material, quartz does not interfere with RF fields within plasma chambers, allowing stable plasma formation and consistent process conditions.

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