Quartz Shadow Ring 200mm
The AMAT 0200-10445 Quartz Shadow Ring (200mm) is a process-critical quartz component designed for plasma etching systems, where precise control of wafer edge behavior is essential. Positioned near the wafer perimeter within the plasma zone, it creates a controlled shadowing effect that regulates ion distribution, directly influencing etch profile accuracy and critical dimension (CD) uniformity. Engineered for compatibility with Applied Materials (AMAT) 200mm etch platforms, this shadow ring plays a key role in minimizing edge over-etch, stabilizing plasma sheath conditions, and improving overall process repeatability. Its optimized geometry also supports controlled gas flow and reduces unwanted by-product deposition, contributing to cleaner chamber environments and higher yield. Looking forward to your inquiry.
Description
The AMAT 0200-10445 Quartz Shield Ring (200 mm) is a high-purity quartz edge control component designed specifically for plasma etching systems. It falls under the category of shield rings, which are critical for controlling plasma interaction at the wafer edges during semiconductor processing.
Manufactured from ultra-high-purity fused quartz, this component is engineered to operate under extreme process conditions, including:
● High-energy plasma environments
● Reactive fluorine- and chlorine-based chemicals
● Repeated thermal cycling
Unlike standard protective components, the shadow ring is a process-critical part that directly influences etch profile, uniformity, and critical dimension (CD) control.
At Semixlab Technology, our quartz shadow rings are manufactured using the following processes:
● Strict raw material selection to ensure low contamination
● High-precision machining to ensure geometric consistency
● Optimized surface treatment to minimize particle generation
This ensures stable and repeatable performance in advanced etching processes.
Common Failure Modes
As a consumable component exposed to harsh plasma environments, quartz shadow rings are subject to the following degradation mechanisms:
1. Plasma-Induced Erosion
● Continuous ion bombardment leads to surface roughening
● Gradual material loss alters critical geometries
Impact:
Deterioration of edge control performance, resulting in critical dimension (CD) deviations and profile instability.
2. Polymer and Byproduct Deposition
● Process byproducts accumulate on the quartz surface
● Deposits may flake off during operation
Impact:
Increased particle contamination and defect density on wafers.
3. Thermal Stress Cracking
● Repeated heating and cooling cycles generate internal stresses
● Microcracks may propagate, leading to structural failure
Impact:
Unexpected breakage and equipment downtime.
4. Particle Generation Due to Material Aging
● Long-term plasma exposure compromises the integrity of the quartz
● Microcracks release particles into the chamber
Impact:
Decreased yield and reduced device reliability.
Why Choose Semixlab?
With deep expertise in semiconductor materials and process components, Semixlab Technology offers high-performance replacement parts that meet or exceed OEM standards:
● Ultra-high-purity quartz for contamination-sensitive processes
● Precision-engineered geometries for exact edge control
● Extended service life and reduced cost of ownership (CoO)
● OEM-compatible designs that integrate seamlessly with AMAT platforms
Our quartz shadow rings are trusted by semiconductor fabs, supporting manufacturers seeking reliable, cost-effective, and high-performance alternatives for plasma etching applications.
Applications
Equipment Location and Functions
Installation Location
Quartz shadow rings are typically installed:
● Around the wafer edge region
● Above or near the electrostatic chuck (ESC)
● Within the plasma sheath region of the etch chamber
It works in conjunction with other edge components (such as focusing rings and cover rings) to form a complete edge control system.
Core Functions
1. Plasma Shielding and Ion Distribution Control
The primary function of the shield ring is to create a “shielding effect”:
● Selectively blocking or modulating plasma exposure at the wafer edge
● Adjusting ion incidence angles and ion distribution
Results:
Improved etch profile control, including sidewall angles and feature fidelity.
2. Edge Uniformity Optimization
Through its precisely engineered geometry (height, gap, and profile), the shadow ring can:
● Reduce edge over-etching and micro-load effects
● Improve etch rate uniformity across the wafer
Impact:
Improves critical dimension (CD) consistency and enhances wafer edge yield.
3. Process Stability and Repeatability
This component stabilizes plasma behavior in the edge region by:
● Maintaining consistent plasma sheath conditions
● Reduce process drift during extended production runs
Benefits:
Improves process window stability and repeatability in high-volume production.
4. Contamination and Byproduct Control
The shadow ring also helps to:
● Limit unwanted deposition areas
● Control the distribution of polymers and byproducts
This reduces particle risk and contributes to cleaner chamber operation.
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