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AMAT 0200-09911 QUARTZ COVER RING
AMAT QUARTZ COVER RING
AMAT 0200-09911 QUARTZ COVER RING
AMAT QUARTZ COVER RING

0200-09911 Quartz Cover Ring


The AMAT 0200-09911 Quartz Cover Ring is a critical high-purity quartz consumable used in plasma etch chambers to protect internal components and ensure stable process performance. Installed around the wafer edge region, it acts as a sacrificial barrier against plasma exposure while playing a key role in edge profile control and etch uniformity optimization. Engineered for compatibility with Applied Materials 200mm etch platforms, this quartz cover ring supports consistent gas flow dynamics and minimizes contamination risks in high-energy processing environments.

Description

The AMAT 0200-09911 Quartz Cover Ring is a precision-engineered high-purity quartz component designed for use in plasma etching systems. It functions as a protective and process-regulating ring installed within the etch chamber, particularly in 200mm wafer processing platforms.

Manufactured from ultra-high purity fused quartz, this component is optimized for extreme semiconductor environments characterized by:

● High-energy plasma exposure

● Reactive chemical gases (e.g., fluorine-based chemistries)

● Rapid thermal cycling conditions

At Semixlab Technology, this product is fabricated with strict control over:

● Material purity (low metallic contamination)

● Dimensional tolerances (critical for edge process control)

● Surface finish (minimizing particle generation)

This ensures consistent performance in advanced semiconductor fabrication processes.

Common Failure Modes

As a consumable component operating under harsh plasma conditions, the Quartz Cover Ring is subject to several degradation mechanisms:

1. Plasma-Induced Erosion

● Surface roughening due to ion bombardment

● Gradual material loss altering geometry

Impact: Reduced etch uniformity and unstable process performance

2. Chemical Deposition and Contamination

● Polymer or by-product accumulation on the surface

● Flaking or peeling during thermal cycling

Impact: Particle generation and wafer contamination

3. Thermal Stress Cracking

● Repeated heating and cooling cycles induce micro-cracks

● Crack propagation leading to structural failure

Impact: Sudden breakage and unplanned downtime

4. Particle Generation

● Aging quartz leads to micro-fractures

● Surface degradation releases particles into the chamber

Impact: Yield loss and defectivity increase

Why Choose Semixlab Technology?

At Semixlab Technology, we combine deep semiconductor process expertise with advanced quartz fabrication capabilities to deliver:

● High-purity quartz materials for ultra-clean processing

● Precision machining for exact OEM compatibility

● Optimized lifetime performance to reduce cost of ownership (CoO)

● Strict quality control aligned with semiconductor fab standards

Our replacement parts are engineered to meet or exceed OEM specifications, ensuring seamless integration and reliable performance in demanding etch environments.

Applications

Position in Equipment and Functional Role

Installation Position

The Quartz Cover Ring is typically installed:

● Around the wafer edge region

● On or near the electrostatic chuck (ESC) perimeter

● Within the plasma exposure zone of the etch chamber

It operates as part of the edge control assembly, working alongside components such as focus rings and shadow rings.

Core Functions

1. Chamber and Component Protection

The ring acts as a sacrificial barrier, shielding critical components (such as ESCs and chamber walls) from:

● Direct plasma bombardment

● Chemical corrosion

● Ion-induced sputtering

This significantly extends the service life of high-value chamber components.

2. Plasma Edge Control and Process Stability

The engineered geometry (e.g., stepped profiles and notched features) helps:

● Regulate plasma sheath distribution near the wafer edge

● Minimize edge effect deviations

● Improve etch uniformity and CD (critical dimension) control

This is especially crucial in high-precision pattern transfer processes.

3. Gas Flow and By-product Management

The cover ring contributes to:

● Controlled gas flow dynamics at the wafer edge

● Reduced polymer accumulation in undesired regions

● Stabilized chamber conditions over long process runs

This directly supports repeatability and yield improvement.

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