SiC Coated Epi susceptor
The SiC Coated Epi Susceptor from Semixlab is a high-performance wafer support component designed for advanced semiconductor epitaxy (EPI) processes. By integrating a high-purity graphite substrate with a dense CVD silicon carbide coating, the susceptor is engineered to directly support wafer heating and growth stability, the SiC Coated Epi Susceptor plays a critical role in achieving uniform epitaxial thickness, consistent dopant incorporation, and low defect density. We look forward to receiving your inquiry.
Description
The SiC-coated epitaxial susceptor is a critical component in semiconductor epitaxy (EPI) processes, where precise temperature control, chemical stability, and ultra-low contamination are essential for achieving high-quality epitaxial layers.
Within the epitaxial reactor, the susceptor directly supports the wafer and determines the thermal and chemical boundary conditions during crystal growth. Unlike passive chamber liners, epitaxial susceptors actively influence temperature uniformity, growth kinetics, and dopant distribution. By combining a high-purity graphite substrate with a dense CVD silicon carbide coating, the Silicon Carbide Coated Epi susceptor delivers long-term process stability under extreme operating conditions.
Primary Functions and Roles in Epitaxial Processes
1. Wafer Support and Precise Thermal Management
During epitaxial growth, wafers are exposed to temperatures typically exceeding 1000°C to 1600°C. The SiC Coated Epi susceptor provides a stable mechanical platform with excellent thermal conductivity, ensuring efficient and uniform heat transfer to the wafer. The Silicon Carbide Coating maintains consistent surface properties over extended periods, supporting uniform temperature distribution across the wafer surface and minimizing center-to-edge temperature gradients that could cause variations in thickness and resistivity.
2. Chemical Isolation and Contamination Control
Epitaxial processes typically occur in high-purity hydrogen atmospheres using reactive precursors such as silanes, chlorosilanes, and carbon-containing gases. Under these conditions, unprotected graphite substrates are vulnerable to chemical etching, abrasion, and particle generation. A high-density CVD silicon carbide coating serves as a robust diffusion barrier, effectively isolating the graphite core from corrosive gases and preventing the release of metal or carbon-related contaminants.
3. Stable Growth Interface and Process Repeatability
The surface characteristics of the susceptor play a crucial role in shaping gas flow, boundary layer behavior, and radiative heat transfer within the epitaxial chamber. Semixlab's Silicon Carbide Coated Epi susceptor features controlled surface topography and consistent emissivity, helping maintain stable process conditions across each run. This stability supports repeatable epitaxial growth rates, uniform dopant incorporation, and reliable wafer-to-wafer and device-to-device matching in high-volume production lines.
4. Thermal Cycling Resistance and Extended Service Life
Epitaxial equipment undergoes frequent thermal cycling and aggressive in-situ cleaning. Thermal expansion compatibility between the SiC coating and graphite substrate minimizes mechanical stress during heating and cooling, reducing the risk of cracking or delamination. Compared to uncoated or PVD-coated substrates, the CVD SiC coating design delivers superior durability, extending preventive maintenance intervals and lowering total cost of ownership without compromising process performance.
Every Silicon Carbide Coated Epi susceptor from Semixlab is manufactured under extremely stringent process controls, emphasizing coating purity, thickness uniformity, and adhesion strength. As a leading technology enterprise in China's semiconductor epitaxial process sector, Semixlab remains committed to providing advanced technologies and customized SiC Coated Epi susceptor solutions for the semiconductor industry. Semixlab sincerely looks forward to becoming your long-term partner in China.
Specifications
| Basic physical properties of CVD SiC coating | |
| Property | Typical Value |
| Crystal Structure | FCC β phase polycrystalline, mainly (111) oriented |
| Density | 3.21 g/cm³ |
| Hardness | 2500 Vickers hardness(500g load) |
| Grain Size | 2~10μm |
| Chemical Purity | 99.99995% |
| Heat Capacity | 640 J·kg-1·K-1 |
| Sublimation Temperature | 2700℃ |
| Flexural Strength | 415 MPa RT 4-point |
| Young' s Modulus | 430 Gpa 4pt bend, 1300℃ |
| Thermal Conductivity | 300W·m-1·K-1 |
| Thermal Expansion(CTE) | 4.5×10-6K-1 |
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